Logical Diagnosis Solutions Must Drive Yield Improvement
نویسنده
چکیده
Introduction Can automated solutions for logic diagnosis become a fundamental driver of yield improvement? or are they doomed to remain an “occasional entertaining diversion?” As we begin driving a transition in diagnosis from science projects to industrial solutions, we need to consider the differences between failure analysis (FA) and low yield analysis (LYA). We need to comprehend that this technology is critical, not just “nice to have.” And we need to drive development based on cutting edge research, supporting design features and validation in production silicon.
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